Advances in Atomic Force Microscopy: Pushing the LIMITS of Magnetic Force Microscopy

Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy (AFM) method used for investigating and mapping magnetic properties of surfaces. It is the ideal technique to image the spatial distribution of magnetic states in a sample. In vacuum, MFM offers improved sensitivity and thus allows for high-resolution magnetic domain imaging.

In various fields of study from material research to biological sciences, MFM is an important tool for detecting nanoscale magnetic domains by measuring the interaction force between a magnetic tip and sample.

• Date: Thursday, October, 1
• Place: Amphitheatre Room, Laboratoire de Physique des Solides • UMR 8502-Campus universitaire-Bât.510 • F-91405 Orsay Cedex
• Time: 9:30-17:30

In this workshop you will learn about the latest advances in magnetic force microscopy, such as

• the newly developed coupled out-of-plane and in-plane magnetic field generator with variable field strengths allowing for maximum flexibility and customized MFM experiments
• advantages of MFM when measuring in vacuum

The workshop is FREE OF CHARGE and open to all interested scientist.

Lunch and workshop dinner are included.

Registrer here.

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