Subscribe to new articles


This site uses cookies. By continuing to browse the site you are agreeing to our use of cookies. Accept go to Privacy&Cookie Policy

International Conference “Scanning Probe Microscopy” (SPM-2018)

сертификат сзм-2018

On behalf of the local organizing committee it is pleasure for me to thank all the participants of the International Conference “Scanning Probe Microscopy” (SPM-2018) combined with International Workshop "Modern Nanotechnologies" (IWMN-2018) and International Youth Conference "Functional Imaging of Nanomaterials"! SPM-2018 welcomed about 150 participants from 10 countries and 22 cities of Russia.

The conference witnessed 7 industrial, 18 invited, 36 oral, and 108 poster presentations. The proceedings will be published as the special issues of IOP Conference Series: Materials Science and Engineering and FERROELECTRICS journals.

Organizing committee acknowledges sponsors and exhibitors: Taylor & Francis, Russian Foundation for Basic Research, NT-MDT Spectrum Instruments, Promenergolab, OSTEC, OPTEC, INTERTECH Corporation, Merck, and IMC. Special thanks to Alexander Lukanin, who sponsored the awards for the best oral and poster presentations of young scientists.

промэнерголаб на SPM-2018